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Behavioral test generation modeling approach for mixed-signal IC verification.
Veikko Loukusa
Published in:
Microelectron. J. (2003)
Keyphrases
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test generation
symbolic execution
test cases
design automation
static analysis
software testing
quality assurance
mixed signal
low power
code coverage
real time
machine vision
parallel processing
model checking
test set
decision trees
image processing
data sets