Login / Signup

Masking Internal Node Faults and Trojan Circuits in Logical Circuits.

Anzhela Yu. MatrosovaV. ProvkinEkaterina Nikolaeva
Published in: EWDTS (2019)
Keyphrases
  • internal nodes
  • fault models
  • fault diagnosis
  • built in self test
  • artificial intelligence
  • decision trees
  • data structure
  • object recognition
  • data model