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Making split-fabrication more secure.

Ping-Lin YangMalgorzata Marek-Sadowska
Published in: ICCAD (2016)
Keyphrases
  • integrated circuit
  • high density
  • security protocols
  • data sets
  • neural network
  • high speed
  • key management
  • authentication scheme
  • real time
  • databases
  • lightweight
  • standard model
  • electron beam