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A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint.
Ryoichi Inoue
Toshinori Hosokawa
Hideo Fujiwara
Published in:
IEICE Trans. Inf. Syst. (2010)
Keyphrases
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generation method
artificial intelligence
computer vision
decision making
clustering algorithm
database systems
multiscale
test cases
test data
finite state machines
set of test cases