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DRAM Bender: An Extensible and Versatile FPGA-Based Infrastructure to Easily Test State-of-the-Art DRAM Chips.

Ataberk OlgunHasan HassanAbdullah Giray YaglikçiYahya Can TugrulLois OrosaHaocong LuoMinesh PatelOguz ErginOnur Mutlu
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
  • high density
  • main memory
  • low voltage
  • application specific
  • high speed
  • data center
  • dynamic random access memory
  • data model
  • nearest neighbor
  • test cases
  • test data
  • markup language
  • design considerations