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Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture.

Hideo FujiwaraJiaguang SunKrishnendu ChakrabartyYang ZhaoDong Xiang
Published in: ATS (2006)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data sets
  • training set
  • training and test data
  • databases
  • supervised learning
  • testing process