Detection and Compensation of Motion Error for Nanomanipulation Platform in Scanning Electron Microscope.
Mingyu WangYaqiong WangZhan YangTao ChenLining SunToshio FukudaPublished in: ICARCV (2018)
Keyphrases
- scanning electron microscope
- motion estimation
- motion analysis
- motion field
- automatic detection
- motion model
- false alarms
- detection method
- image sequences
- motion tracking
- detection rate
- error rate
- real time
- moving objects
- optical flow
- motion parameters
- object detection
- detection accuracy
- detection algorithm
- space time
- human motion
- motion segmentation
- motion detection
- motion patterns
- motion planning
- reference frame
- false positive rate
- shot change detection
- log polar mapping