A High-Density Scalable Twin Transistor RAM (TTRAM) With Verify Control for SOI Platform Memory IPs.
Kazutami ArimotoFukashi MorishitaIsamu HayashiKatsumi DosakaHiroki ShimanoTakashi IpposhiPublished in: IEEE J. Solid State Circuits (2007)
Keyphrases
- high density
- low density
- field effect transistors
- close proximity
- control system
- data center
- thin film
- magnetic recording
- high power
- control strategy
- design considerations
- random access memory
- high bandwidth
- limited memory
- low power
- low memory
- magnetic tape
- main memory
- high speed
- flash memory
- low latency
- real time
- parallel processing
- power consumption
- data structure