Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths.

Thomas Edison Yu Tomokazu Yoneda Satoshi Ohtake Hideo Fujiwara

Published in: ATS (2008)

Keyphrases

shortest path
data sets
databases
multiscale
low cost
high speed
neural network
learning algorithm
three dimensional
path planning
parameter tuning
path finding
path length