Comparing feature detectors: A bias in the repeatability criteria.
Ives Rey-OteroMauricio DelbracioJean-Michel MorelPublished in: ICIP (2015)
Keyphrases
- feature detectors
- feature detection
- corner detectors
- scale space
- feature points
- scale invariant
- detection method
- detection algorithm
- preprocessing
- affine invariant
- image analysis
- image features
- edge detector
- object recognition
- feature detection and description
- computer vision
- affine transformation
- multiscale
- three dimensional