FEATURE DETECTION AND DESCRIPTION
Experts
- Michael M. Bronstein
- Afzal Godil
- Alexander M. Bronstein
- Apostolos Axenopoulos
- Petros Daras
- Benjamin Bustos
- Remco C. Veltkamp
- Andrea Giachetti
- Ivan Sipiran
- Leonidas J. Guibas
- Ryutarou Ohbuchi
- Matthieu Montès
- Paul L. Rosin
- Maks Ovsjanikov
- Slimane Larabi
- Michela Spagnuolo
- Zhouhui Lian
- Andrei Zaharescu
- Frank B. ter Haar
- James E. Gary
- Takahiko Furuya
- Silvia Biasotti
- Masaki Aono
- Bo Li
- Helin Dutagaci
- Nabil Aouf
- Naif Alajlan
- Atsushi Tatsuma
- Yijuan Lu
- Dirk Smeets
- Daisuke Kihara
- Radu Horaud
- Rajiv Mehrotra
- Yosi Keller
- Florent Langenfeld
- Roee Litman
- Paul Suetens
- Ives Rey-Otero
- Dirk Vandermeulen
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- IEEE Trans. Image Process.
- Image Vis. Comput.
- ICPR
- Pattern Recognit. Lett.
- ICIP
- CVPR
- Vis. Comput.
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- ACM Trans. Graph.
- ICMCS, Vol. 1
- IROS
- SAC
- ICASSP
- IET Image Process.
- ICPR (3)
- SIGIR
- Signal Process. Image Commun.
- IEEE Access
- Neurocomputing
- ICASSP (3)
- J. Vis. Commun. Image Represent.
- ICME
- CEC
- Inf. Syst.
- ICRA
- 3DPVT
- CAEPIA
- ECCV (1)
- Digit. Signal Process.
- NCVPRIPG
- ICPRAM
- ACPR
- ISVC (3)
- ECCV (3)
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