FEATURE DETECTION AND DESCRIPTION
Experts
- Michael M. Bronstein
- Alexander M. Bronstein
- Afzal Godil
- Benjamin Bustos
- Apostolos Axenopoulos
- Petros Daras
- Andrea Giachetti
- Remco C. Veltkamp
- Ivan Sipiran
- Maks Ovsjanikov
- Ryutarou Ohbuchi
- Slimane Larabi
- Zhouhui Lian
- Leonidas J. Guibas
- Michela Spagnuolo
- Paul L. Rosin
- Matthieu Montès
- Naif Alajlan
- Atsushi Tatsuma
- Rajiv Mehrotra
- Silvia Biasotti
- Radu Horaud
- Roee Litman
- Nabil Aouf
- Guojun Lu
- Edmond Boyer
- Florent Langenfeld
- Mauricio Delbracio
- Frank B. ter Haar
- Dengsheng Zhang
- Yijuan Lu
- Andrei Zaharescu
- Daisuke Kihara
- Bo Li
- Dirk Vandermeulen
- Umberto Castellani
- Yosi Keller
- Genki Terashi
- Dirk Smeets
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- IEEE Trans. Image Process.
- Image Vis. Comput.
- ICPR
- ICIP
- Pattern Recognit. Lett.
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Multim. Tools Appl.
- Vis. Comput.
- CVPR
- IEEE Access
- ICME
- SIGIR
- ICASSP
- ICPR (3)
- ICASSP (3)
- SAC
- Neurocomputing
- IROS
- J. Vis. Commun. Image Represent.
- Signal Process. Image Commun.
- IET Image Process.
- ICMCS, Vol. 1
- MUSCLE
- Inf. Syst.
- ECMR
- AIST
- IEEE Trans. Computers
- VDB
- J. Comput. Civ. Eng.
- WACV
- Comput. Vis. Image Underst.
- Multimedia Information Retrieval
- ICCV Workshops
- Int. J. Comput. Vis. Image Process.
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