FEATURE DETECTION AND DESCRIPTION
Experts
- Alexander M. Bronstein
- Michael M. Bronstein
- Afzal Godil
- Remco C. Veltkamp
- Petros Daras
- Apostolos Axenopoulos
- Benjamin Bustos
- Andrea Giachetti
- Ivan Sipiran
- Ryutarou Ohbuchi
- Leonidas J. Guibas
- Zhouhui Lian
- Maks Ovsjanikov
- Matthieu Montès
- Paul L. Rosin
- Michela Spagnuolo
- Slimane Larabi
- Bo Li
- Yosi Keller
- Radu Horaud
- Naif Alajlan
- Roee Litman
- James E. Gary
- Nabil Aouf
- Guojun Lu
- Dirk Smeets
- Frank B. ter Haar
- Daisuke Kihara
- Rajiv Mehrotra
- Dengsheng Zhang
- Mauricio Delbracio
- Takahiko Furuya
- Atsushi Tatsuma
- Dirk Vandermeulen
- Yijuan Lu
- Helin Dutagaci
- Silvia Biasotti
- Andrei Zaharescu
- Umberto Castellani
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- IEEE Trans. Image Process.
- Image Vis. Comput.
- Pattern Recognit. Lett.
- ICPR
- ICIP
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- Pattern Recognit.
- Multim. Tools Appl.
- Vis. Comput.
- Signal Process. Image Commun.
- ICASSP
- SIGIR
- IEEE Access
- ICPR (3)
- IET Image Process.
- J. Vis. Commun. Image Represent.
- SAC
- Neurocomputing
- ICASSP (3)
- ICME
- IROS
- ICMCS, Vol. 1
- ICSLP
- ICIC (2)
- ICVS
- IEEE Trans. Circuits Syst. Video Technol.
- DSP
- Comput. Graph. Forum
- Neural Comput.
- VISAPP (1)
- IPCV
- ECCV Workshops (4)
- Int. J. Comput. Vis. Image Process.
- APCC
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