FEATURE DETECTION AND DESCRIPTION
Experts
- Michael M. Bronstein
- Alexander M. Bronstein
- Afzal Godil
- Petros Daras
- Remco C. Veltkamp
- Andrea Giachetti
- Benjamin Bustos
- Apostolos Axenopoulos
- Ivan Sipiran
- Leonidas J. Guibas
- Ryutarou Ohbuchi
- Slimane Larabi
- Michela Spagnuolo
- Paul L. Rosin
- Matthieu Montès
- Maks Ovsjanikov
- Zhouhui Lian
- Daisuke Kihara
- Frank B. ter Haar
- Dirk Smeets
- Guojun Lu
- Nabil Aouf
- James E. Gary
- Roee Litman
- Naif Alajlan
- Radu Horaud
- Yosi Keller
- Bo Li
- Florent Langenfeld
- Masaki Aono
- Edmond Boyer
- Genki Terashi
- Rong-Xiang Hu
- Paul Suetens
- Umberto Castellani
- Ives Rey-Otero
- Helin Dutagaci
- Silvia Biasotti
- Andrei Zaharescu
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- IEEE Trans. Image Process.
- Image Vis. Comput.
- Pattern Recognit. Lett.
- ICPR
- ICIP
- CVPR
- Pattern Recognit.
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- Vis. Comput.
- IEEE Access
- ICPR (3)
- IET Image Process.
- J. Vis. Commun. Image Represent.
- Signal Process. Image Commun.
- ICASSP
- SIGIR
- ICME
- IROS
- ICMCS, Vol. 1
- SAC
- Neurocomputing
- ICASSP (3)
- CAEPIA
- FUSION
- MRDM@ECIR
- ACIS-ICIS
- SIBGRAPI
- FSKD
- ECCV (5)
- ACPR
- IAIT
- ExpDB
- ICRA
- AIST
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