FEATURE DETECTION AND DESCRIPTION
Experts
- Afzal Godil
- Michael M. Bronstein
- Alexander M. Bronstein
- Benjamin Bustos
- Petros Daras
- Andrea Giachetti
- Remco C. Veltkamp
- Apostolos Axenopoulos
- Ivan Sipiran
- Maks Ovsjanikov
- Michela Spagnuolo
- Ryutarou Ohbuchi
- Matthieu Montès
- Slimane Larabi
- Paul L. Rosin
- Zhouhui Lian
- Leonidas J. Guibas
- Naif Alajlan
- Paul Suetens
- Atsushi Tatsuma
- Rajiv Mehrotra
- Yijuan Lu
- Roee Litman
- Edmond Boyer
- Takahiko Furuya
- Umberto Castellani
- Daisuke Kihara
- Masaki Aono
- Radu Horaud
- Ives Rey-Otero
- Bo Li
- Genki Terashi
- Helin Dutagaci
- Rong-Xiang Hu
- Mauricio Delbracio
- Dirk Smeets
- Silvia Biasotti
- Guojun Lu
- Nabil Aouf
Venues
- 3DOR@Eurographics
- CoRR
- Shape Modeling International
- IEEE Trans. Image Process.
- Image Vis. Comput.
- Pattern Recognit. Lett.
- ICPR
- ICIP
- CVPR
- ACM Trans. Graph.
- Pattern Recognit.
- Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- ICPR (3)
- ICASSP
- ICME
- ICMCS, Vol. 1
- Signal Process. Image Commun.
- IET Image Process.
- IROS
- J. Vis. Commun. Image Represent.
- Neurocomputing
- ICASSP (3)
- IEEE Access
- SAC
- Storage and Retrieval for Media Databases
- VISAPP (1)
- Adv. Multim.
- CAIP
- ISCIS
- Symposium on Solid Modeling and Applications
- Bioinform.
- Computer
- Int. J. Inf. Retr. Res.
- SSPR/SPR
- ICIAR (1)
- Neural Comput.
- Mach. Vis. Appl.
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