FEATURE DETECTION AND DESCRIPTION
Experts
- Afzal Godil
- Michael M. Bronstein
- Alexander M. Bronstein
- Petros Daras
- Benjamin Bustos
- Apostolos Axenopoulos
- Remco C. Veltkamp
- Andrea Giachetti
- Ivan Sipiran
- Matthieu Montès
- Paul L. Rosin
- Leonidas J. Guibas
- Ryutarou Ohbuchi
- Maks Ovsjanikov
- Slimane Larabi
- Zhouhui Lian
- Michela Spagnuolo
- Masaki Aono
- Bo Li
- James E. Gary
- Takahiko Furuya
- Silvia Biasotti
- Andrei Zaharescu
- Frank B. ter Haar
- Naif Alajlan
- Atsushi Tatsuma
- Yijuan Lu
- Dirk Smeets
- Helin Dutagaci
- Nabil Aouf
- Roee Litman
- Paul Suetens
- Yosi Keller
- Florent Langenfeld
- Ives Rey-Otero
- Rajiv Mehrotra
- Daisuke Kihara
- Radu Horaud
- Edmond Boyer
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- IEEE Trans. Image Process.
- Image Vis. Comput.
- ICIP
- Pattern Recognit. Lett.
- ICPR
- Vis. Comput.
- CVPR
- ACM Trans. Graph.
- Multim. Tools Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- IET Image Process.
- SAC
- ICASSP
- ICMCS, Vol. 1
- IROS
- Neurocomputing
- J. Vis. Commun. Image Represent.
- ICASSP (3)
- ICME
- IEEE Access
- ICPR (3)
- SIGIR
- Signal Process. Image Commun.
- Bioinform.
- FUSION
- Storage and Retrieval for Media Databases
- IWCIA
- MRDM@ECIR
- CATA
- ACIS-ICIS
- IAIT
- VISIGRAPP (4: VISAPP)
- ISSPA (1)
- BIOINFORMATICS
- PSIVT
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