FEATURE DETECTION AND DESCRIPTION
Experts
- Alexander M. Bronstein
- Afzal Godil
- Michael M. Bronstein
- Remco C. Veltkamp
- Apostolos Axenopoulos
- Benjamin Bustos
- Petros Daras
- Andrea Giachetti
- Ivan Sipiran
- Leonidas J. Guibas
- Zhouhui Lian
- Matthieu Montès
- Michela Spagnuolo
- Paul L. Rosin
- Maks Ovsjanikov
- Ryutarou Ohbuchi
- Slimane Larabi
- Genki Terashi
- Yosi Keller
- Dirk Smeets
- Rong-Xiang Hu
- Bo Li
- Umberto Castellani
- Dirk Vandermeulen
- Paul Suetens
- Ives Rey-Otero
- Masaki Aono
- James E. Gary
- Helin Dutagaci
- Takahiko Furuya
- Nabil Aouf
- Guojun Lu
- Roee Litman
- Edmond Boyer
- Naif Alajlan
- Atsushi Tatsuma
- Rajiv Mehrotra
- Silvia Biasotti
- Radu Horaud
Venues
- CoRR
- 3DOR@Eurographics
- Shape Modeling International
- Image Vis. Comput.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICPR
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- Vis. Comput.
- CVPR
- ACM Trans. Graph.
- Pattern Recognit.
- Neurocomputing
- IROS
- ICASSP (3)
- SAC
- ICMCS, Vol. 1
- Signal Process. Image Commun.
- IET Image Process.
- J. Vis. Commun. Image Represent.
- SIGIR
- ICME
- IEEE Access
- ICPR (3)
- ICASSP
- IPCV
- CATA
- Bioinform.
- IEEE Trans. Commun.
- ISCIS
- AVSS
- ICSLP
- 3DPVT
- APCC
- CTIC
- SSPR/SPR
- Int. J. Multim. Inf. Retr.
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