A 3D IC BIST for pre-bond test of TSVs using ring oscillators.

Yassine Fkih Pascal Vivet Bruno Rouzeyre Marie-Lise Flottes Giorgio Di Natale

Published in: NEWCAS (2013)

Keyphrases

built in self test
integrated circuit
neural network
website
image processing
communication systems
machine learning
special case
learning algorithm
computer vision
web services
test cases
statistical significance
post test