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A 3D IC BIST for pre-bond test of TSVs using ring oscillators.
Yassine Fkih
Pascal Vivet
Bruno Rouzeyre
Marie-Lise Flottes
Giorgio Di Natale
Published in:
NEWCAS (2013)
Keyphrases
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built in self test
integrated circuit
neural network
website
image processing
communication systems
machine learning
special case
learning algorithm
computer vision
web services
test cases
statistical significance
post test