Fault Simulation for Analog Circuits Under Parameter Variations.
Abdelhakim KhouasAnne DerieuxPublished in: J. Electron. Test. (2000)
Keyphrases
- analog circuits
- fault diagnosis
- fault detection
- wavelet packet transform
- neural network
- digital circuits
- simulation models
- parameter space
- parameter values
- multiple faults
- real time
- machine learning
- simulation environment
- artificial intelligence
- parameter settings
- image processing
- simulation model
- computer vision
- high speed
- low cost
- software engineering
- state space
- expert systems