On Minimization of Peak Power for Scan Circuit during Test.

Jaynarayan T. Tudu Erik Larsson Virendra Singh Vishwani D. Agrawal

Published in: ETS (2009)

Keyphrases

power reduction
power consumption
single phase
objective function
high speed
control system
test cases
power system
statistical tests
power dissipation
scan data
databases
neural network
genetic algorithm
low cost