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On Minimization of Peak Power for Scan Circuit during Test.

Jaynarayan T. TuduErik LarssonVirendra SinghVishwani D. Agrawal
Published in: ETS (2009)
Keyphrases
  • power reduction
  • power consumption
  • single phase
  • objective function
  • high speed
  • control system
  • test cases
  • power system
  • statistical tests
  • power dissipation
  • scan data
  • databases
  • neural network
  • genetic algorithm
  • low cost