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A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation.
Youhua Shi
Zhe Zhang
Shinji Kimura
Masao Yanagisawa
Tatsuo Ohtsuki
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2003)
Keyphrases
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case study
class labels
tightly coupled