A Continuous-Adaptive DDR2 Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test.
Masaru HaraguchiTokuya OsawaAkira YamazakiChikayoshi MorishimaToshinori MoriharaYoshikazu MorookaYoshihiro OkunoKazutami ArimotoPublished in: ISSCC (2007)