Impact of silicon nitride CESL on NLDEMOS transistor reliability.

Gaelle Beylier Sylvie Bruyère Darcy Benoit Gérard Ghibaudo

Published in: Microelectron. Reliab. (2008)

Keyphrases

silicon dioxide
high speed
high impact
integrated circuit
factors that influence
database
thin film
databases
information systems
artificial neural networks
special case
highly reliable
reliability analysis