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A Semi-Automated Positioning System for Contact-Mode Atomic Force Microscopy (AFM).

Rajarshi RoyWenjin ChenLei CongLauri A. GoodellDavid J. ForanJaydev P. Desai
Published in: IEEE Trans Autom. Sci. Eng. (2013)
Keyphrases
  • atomic force microscopy
  • semi automated
  • fully automated
  • high level
  • database
  • data sets
  • data streams
  • hidden markov models
  • wifi
  • indoor positioning