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Accelerated On-chip Communication Test Methodology Using a Novel High-Level Fault Model.

Elmira KarimiMohammad Hashem HaghbayanAmir-Mohammad RahmaniMahmoud TabandehPasi LiljebergZainalabedin Navabi
Published in: MCSoC (2015)
Keyphrases
  • fault model
  • high level
  • low level
  • low cost
  • high bandwidth
  • safety analysis
  • conceptual model
  • high density
  • high speed
  • wireless sensor networks
  • higher level
  • computer networks
  • multithreading
  • analog vlsi