Login / Signup

Reliability and failure analysis of SAC 105 and SAC 1205N lead-free solder alloys during drop test events.

Mei-Ling WuJia-Shen Lan
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • event detection
  • machine learning
  • access control
  • test data
  • global optimization
  • failure rate
  • genetic algorithm
  • artificial intelligence
  • case study
  • reliability analysis