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Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement.

Kuen-Jong LeeTong-Yu HsiehMelvin A. Breuer
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
  • neural network
  • cost effective
  • data sets
  • information systems
  • computer vision
  • test cases