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An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits.

Mousum HandiqueJatindra Kumar DekaSantosh Biswas
Published in: J. Electron. Test. (2020)
Keyphrases
  • test set
  • error rate
  • training set
  • test cases
  • test data
  • training data
  • evaluation methodology
  • machine learning
  • missing data
  • face recognition
  • markov chain
  • class distribution