Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits.

S. M. Aziz Joarder Kamruzzaman

Published in: Asian Test Symposium (1998)

Keyphrases

logic circuits
low power
high speed
transmission line
power consumption
low cost
tunnel diode
power dissipation
fault diagnosis
electrical power
logic synthesis
high frequency
fault detection
gate array
signal processing