On-chip network based embedded core testing.

Jong-Sun Kim Min-Su Hwang Seungsu Roh Ja-Young Lee Kangmin Lee Se-Joong Lee Hoi-Jun Yoo

Published in: SoCC (2004)

Keyphrases

low cost
embedded systems
high speed
physical design
test cases
single chip
dynamic random access memory
test data
information retrieval
digital images
case study
watermarking algorithm
software testing
artificial intelligence
vlsi implementation
vlsi design
analog vlsi
real time