Dual Contrastive Learning for Semi-Supervised Fault Diagnosis Under Extremely Low Label Rate.
Linghui LuJun WangWeiguo HuangChangqing ShenJuanjuan ShiZhongkui ZhuPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- fault diagnosis
- semi supervised
- learning algorithm
- fuzzy logic
- supervised learning
- chemical process
- expert systems
- active learning
- fault detection
- case study
- rbf neural network
- bp neural network
- electronic equipment
- genetic algorithm
- analog circuits
- semi supervised learning
- labeled data
- computational intelligence
- training data
- artificial intelligence