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The Mathematical Model and Novel Final Test System for Wafer-Level Packaging.
Junhui Li
Wenya Tian
Hailong Liao
Can Zhou
Xiaohe Liu
Wenhui Zhu
Published in:
IEEE Trans. Ind. Informatics (2017)
Keyphrases
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mathematical model
control strategy
mathematical models
simulation model
ant colony algorithm
levels of abstraction
feasible solution
matlab simulink
test cases
high density
mathematical modeling
real time
neural network
higher level
test data
statistical tests