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A simulation of multilayer thin-film interference for pearl material preproduction.

Kensuke TobitaniAtsushi IshidaAkihiro OkadaLisa ParkKumiko NishiyamaNoriko Nagata
Published in: FCV (2013)
Keyphrases
  • thin film
  • high density
  • silicon nitride
  • short circuit
  • grain size
  • solar cell
  • electron microscopy
  • white light interferometry
  • database
  • sensor networks
  • chemical vapor deposition