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A/μm in capacitorless DRAM achieved by Reactive Ion Etch of IGZO-TFT.

Attilio BelmonteS. KunduS. SubhechhaAdrian Vaisman ChasinNouredine RassoulHarold DekkersH. PuliyalilF. SeidelP. CarolanRomain DelhougneGouri Sankar Kar
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • main memory
  • thin film transistor
  • database
  • high density
  • database systems
  • data structure
  • parallel processing
  • manufacturing process
  • reactive planning