SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits.
Hyung Ki LeeDong Sam HaPublished in: DAC (1990)
Keyphrases
- pattern generator
- built in self test
- high speed
- delay insensitive
- circuit design
- analog vlsi
- vlsi circuits
- asynchronous circuits
- test cases
- logic circuits
- low cost
- low power
- fully automatic
- neural network
- random access memory
- fault diagnosis
- chip design
- power supply
- low voltage
- cmos technology
- power consumption
- power dissipation
- fault detection
- integrated circuit
- human motion
- floating gate
- computer vision