Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks.
Viera StopjakováPavol MalosekDaniel MicusíkMarek MatejMartin MargalaPublished in: J. Electron. Test. (2004)
Keyphrases
- using artificial neural networks
- integrated circuit
- pattern recognition
- artificial neural networks
- classification accuracy
- feature extraction
- feature vectors
- pattern classification
- classification scheme
- support vector machine
- training set
- genetic algorithm
- machine learning
- support vector
- decision trees
- automatic classification
- classification models
- electron beam
- classification algorithm
- support vector machine svm
- text classification
- image classification
- signal processing
- feature space