An image processing approach to the simulation of electron microscopy volumes of atomic structures.
Carlos Oscar Sánchez SorzanoJavier VargasJoaquín OtónVahid AbrishamiJosé Miguel de la Rosa-TrevínS. del RiegoA. Fernandez-AldereteC. Martinez-ReyRoberto MarabiniJosé María CarazoPublished in: ICIP (2014)
Keyphrases
- electron microscopy
- image processing
- x ray
- low energy
- image stacks
- thin film
- pattern recognition
- digital image processing
- machine vision
- remote sensing
- three dimensional
- multiscale
- image enhancement
- computer graphics
- image restoration
- neural network
- edge detection
- denoising
- segmentation method
- signal processing
- data management
- image registration
- color images
- query processing