Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and μ-Path Scans.
Roger A. BrakerYufan LuoLucy Y. PaoSean B. AnderssonPublished in: ACC (2018)
Keyphrases
- atomic force microscopy
- compressive sensing
- random projections
- image recovery
- sparse representation
- compressive sampling
- signal processing
- signal reconstruction
- structured sparsity
- image processing
- distributed source coding
- pattern recognition
- image representation
- feature space
- principal component analysis
- image reconstruction