Test Program Generation for Communication Peripherals in Processor-Based SoC Devices.
Andreas ApostolakisDimitris GizopoulosMihalis PsarakisDanilo RavottoMatteo Sonza ReordaPublished in: IEEE Des. Test Comput. (2009)
Keyphrases
- low power
- embedded systems
- high speed
- test cases
- single chip
- parallel processing
- communication systems
- communication technologies
- mobile applications
- smart phones
- set of test cases
- computing devices
- communication channels
- mobile devices
- software testing
- static analysis
- multiple choice
- test generation
- high end
- computer networks
- network nodes
- test data
- low cost