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A 30+ Year AVHRR Land Surface Reflectance Climate Data Record and Its Application to Wheat Yield Monitoring.

Belen FranchEric F. VermoteJean-Claude RogerEmilie MurphyInbal Becker-ReshefChristopher JusticeMartin ClaverieJyoteshwar R. NagolIvan CsiszarDave MeyerFrédéric BaretEdward J. MasuokaRobert E. WolfeSadashiva Devadiga
Published in: Remote. Sens. (2017)
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