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Thermal damage in SiC Schottky diodes induced by SE heavy ions.
Carmine Abbate
Giovanni Busatto
Paolo Cova
Nicola Delmonte
Francesco Giuliani
Francesco Iannuzzo
Annunziata Sanseverino
Francesco Velardi
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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room temperature
high density
infrared
damage assessment
damage detection
website
case study
bayesian networks
multiscale
design methodology
semiconductor devices