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Copper wire interconnect reliability evaluation using in-situ High Temperature Storage Life (HTSL) tests.

A. MavinkurveLeon GoumansG. M. O'HalloranR. T. H. RongenM.-L. Farrugia
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • high temperature
  • evaluation method
  • database
  • storage and retrieval
  • databases
  • high speed
  • test cases
  • evaluation criteria
  • storage management