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G. M. O'Halloran
Publication Activity (10 Years)
Years Active: 2014-2014
Publications (10 Years): 0
Top Topics
Database
High Temperature
Storage Management
Evaluation Criteria
Top Venues
Microelectron. Reliab.
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Publications
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A. Mavinkurve
,
Leon Goumans
,
G. M. O'Halloran
,
R. T. H. Rongen
,
M.-L. Farrugia
Copper wire interconnect reliability evaluation using in-situ High Temperature Storage Life (HTSL) tests.
Microelectron. Reliab.
54 (9-10) (2014)