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Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets.

Sunil R. DasM. SudarmaMansour H. AssafEmil M. PetriuWen-Ben JoneKrishnendu ChakrabartyMehmet Sahinoglu
Published in: IEEE Trans. Instrum. Meas. (2003)
Keyphrases
  • test set
  • test data
  • data sets
  • test cases
  • vlsi circuits
  • database
  • training data
  • error rate
  • real time
  • support vector
  • pattern recognition
  • hidden markov models
  • data points