Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets.
Sunil R. DasM. SudarmaMansour H. AssafEmil M. PetriuWen-Ben JoneKrishnendu ChakrabartyMehmet SahinogluPublished in: IEEE Trans. Instrum. Meas. (2003)