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Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture.
Youngkwang Lee
Donghyun Han
Sooryeong Lee
Sungho Kang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
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error tolerant
graph matching
silicon dioxide
image processing
liquid crystal