Login / Signup
PDF testability of the circuits derived by special covering ROBDDs with gates.
Anzhela Yu. Matrosova
Ekaterina Nikolaeva
Dmitry Kudin
Virendra Singh
Published in:
EWDTS (2013)
Keyphrases
</>
logic circuits
probability density function
high speed
machine learning
digital circuits
database
real time
data sets
data mining
digital libraries
artificial neural networks
low cost
circuit design
logic synthesis
probability distribution function
tunnel diode