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Reliability Engineering in a Time of Rapidly Converging Technologies.

Shiuhpyng Winston ShiehJeffrey M. VoasPhil LaplanteJason W. RupeChristian K. HansenYu-Sung WuYi-Ting ChenChi-Yu LiKai-Chiang Wu
Published in: IEEE Trans. Reliab. (2024)
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