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Addressing useless test data in core-based system-on-a-chip test.

Paul Theo GonciariBashir M. Al-HashimiNicola Nicolici
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • high speed
  • data sets
  • training set
  • test suite
  • database
  • computer vision
  • error rate
  • training process
  • target domain
  • software testing