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TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm.
Sabyasachi Deyati
Barry John Muldrey
Abhijit Chatterjee
Published in:
VLSI Design (2016)
Keyphrases
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test generation
clustering algorithm
data driven
classification accuracy
classification algorithm
k means
test cases
machine learning
probabilistic model
feature extraction
support vector
high level
text classification
clustering analysis
data sets
database
support vector machine
decision trees
feature selection