Login / Signup
Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points.
Joon-Sung Yang
Benoit Nadeau-Dostie
Nur A. Touba
Published in:
DFT (2009)
Keyphrases
</>
control points
b spline
matching algorithm
point pairs
cubic b spline
point correspondences
d objects
transformation matrix
affine transformation
built in self test
thin plate spline
real time
image matching
computer vision
image analysis
state space