Characterization of silicon field effect transistor sub-THz detectors for imaging systems.
Péter FöldesyPublished in: ISCAS (2012)
Keyphrases
- imaging systems
- field effect transistors
- high density
- steady state
- schottky barrier
- mathematical analysis
- machine vision
- semiconductor devices
- image formation
- light field
- object detection
- stereo images
- markov chain
- synthetic aperture
- image processing
- image sensor
- focal plane
- optical images
- poisson noise
- pairwise
- multimedia