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-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing.

Yuta YamatoXiaoqing WenKohei MiyaseHiroshi FurukawaSeiji Kajihara
Published in: IEICE Trans. Inf. Syst. (2011)
Keyphrases
  • high level
  • high speed
  • domain specific
  • higher level
  • machine learning
  • hidden markov models
  • test suite
  • software testing