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Thermal-Safe Test Access Mechanism and Wrapper Co-optimization for System-on-Chip.
Thomas Edison Yu
Tomokazu Yoneda
Krishnendu Chakrabarty
Hideo Fujiwara
Published in:
ATS (2007)
Keyphrases
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feature selection
test data
optimization algorithm
infrared
global optimization
optimization process
hardware and software
objective function
optimization problems
access control
black box
computational model
power consumption
optimization method
optimization methods
solder ball connect