Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters.
Mandeep SinghIsrael KorenPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2003)
Keyphrases
- sensitivity analysis
- circuit design
- managerial insights
- influence diagrams
- mixed signal
- fault tree
- data conversion
- fault detection
- fault diagnosis
- image processing
- decision variables
- reliability analysis
- variational inequalities
- low power
- printed circuit
- delta sigma
- digital circuits
- analog vlsi
- high speed
- neural network