Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications.
Hyungrock OhAttilio BelmonteManu PerumkunnilJérôme MitardNouredine RassoulGabriele Luca DonadioRomain DelhougneArnaud FurnémontGouri Sankar KarWim DehaenePublished in: ESSDERC (2021)
Keyphrases
- data integrity
- main memory
- metal oxide
- database design
- distributed databases
- data storage
- storage devices
- database systems
- memory subsystem
- database management systems
- client server
- dynamic random access memory
- database
- database administration
- data structure
- active databases
- x ray
- high density
- database administrators
- stored procedures
- databases
- flash memory
- data management
- database management
- index structure
- low voltage
- nearest neighbor