Design of test sequences for VLSI self-testing using LFSR.

Henk D. L. Hollmann

Published in: IEEE Trans. Inf. Theory (1990)

Keyphrases

test sequences
test cases
test generation
vlsi architecture
video sequences
bit rate
design process
mutation testing
data sets
single chip
design methodology
design principles
software engineering
relational databases
high quality
case study
machine learning